This laboratory is used for analysis and characterization of materials
PARK XE-70 Atomic Force Microscope for analysis of materials.
JEOL JSM-7200F Scanning electron microscope with nanoparticle resolution.
JEOL JSM 6400 Scanning Electron Microscope with
EDAX EDS: Energy-dispersive X-ray Spectroscopy (EDS) for chemical analysis.
NORDIF EBSD-system: Electron Back Scatter Diffraction (EBSD) for crystallographic analysis.
Mettler Toledo TGA / DSC1. Thermogravimetry (TGA) is a technique that measures the change in weigth of a sample as it is heated, cooled or held at constant temperature. Differential scanning calorimetry (DSC) measures enthalpy changes in samples due to changes in their physical and chemical properties as a function of temperature or time.